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Application and Design of Metrics for Software Process Measurement
Sun Myung Hwang , Hee Gyun Yeom The KIPS Transactions:PartD,
Vol. 12, No. 7, pp. 937-946,
Dec.
2005
10.3745/KIPSTD.2005.12.7.937
10.3745/KIPSTD.2005.12.7.937
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